Contactless spectroscopy of photoactive centres in sapphire and nitride layered structures-Reference-Cited by-同舟云学术

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Contactless spectroscopy of photoactive centres in sapphire and nitride layered structures

Published:2024-08 Issue: Volume:154 Page:115641
ISSN:0925-3467
Container-title:Optical Materials
language:en
Short-container-title:Optical Materials

Author:

Ceponis T.^ORCID,Deveikis L.^ORCID,Kovalevskij V.,Mickevicius J.^ORCID,Rumbauskas V.^ORCID,Gaubas E.

Funder

CERN

Lietuvos Mokslo Taryba

Publisher

Elsevier BV

Reference31 articles.

1. A modified and calibrated drift-diffusion-reaction model for time-domain analysis of charging phenomena in electron-beam irradiated insulators;Raftari;AIP Adv.,2018

2. Vacuum ultraviolet, photoemission and theoretical studies of the electronic structure of Al2O3 up to 1000°C;French;Phys. B+C,1988

3. Analysis of the electron paramagnetic resonance zero-field splitting for Fe3+ in sapphire;Xiao-Yu;Phys. Rev. B,1987

4. Determining residual impurities in sapphire by means of electron paramagnetic resonance and nuclear activation analysis;Bletskan;Tech. Phys. Lett.,2008

5. Electron spin resonance study on pure single crystalline sapphire;Hori;Phys. Status Solidi C,2013

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