Simulation of anti-reflecting dielectric films by the interference matrix method

Author:

Politanskyi R.L.,Vistak M.V.,Barylo G.I.,Andrushchak A.S.

Funder

European Union

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials,Inorganic Chemistry,Organic Chemistry,Physical and Theoretical Chemistry,Spectroscopy

Reference13 articles.

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2. Antireflection multilayer coatings with thin metal layers;Konstantinova;Sci. and Tech. J. of Inf. Tech., Mech. and Opt., N,2016

3. Atomic layer deposition of Al2O3 and TiO2 multilayers for applications as bandpass filters and antireflection coatings;Szeghalmi;Appl. Optic. V.,2009

4. Broadband antireflective coating by the method of molecular layer deposition;Khoa Fam;Izv. Vysš. Včebn. Zaved. Prib., V,2018

5. Dynamical x-ray diffraction of multilayers and superlattices: recursion matrix extension to grazing angles;Stepanov;Phys. Rev. B V.,1998

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