Fabrication of UV photodetector based on GaN/ Psi heterojunction using pulse laser deposition method: Effect of different laser wavelengths-Reference-Cited by-同舟云学术

Fabrication of UV photodetector based on GaN/ Psi heterojunction using pulse laser deposition method: Effect of different laser wavelengths

Published:2023-03 Issue: Volume:137 Page:113593
ISSN:0925-3467
Container-title:Optical Materials
language:en
Short-container-title:Optical Materials

Author:

Fakhri Makram A.^ORCID,AbdulRazzaq Mohammed Jalal,Jabbar Haneen D.,Salim Evan T.,Alsultany Forat H.,Hashim U.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials,Inorganic Chemistry,Organic Chemistry,Physical and Theoretical Chemistry,Spectroscopy

Reference84 articles.

1. Properties of Advanced Semiconductor Materials : GaN;Levinshtein,2001

2. Gallium nitride (GaN) nanostructures and their gas sensing properties: a review;Khan;Sensors,2020

3. Optical investigations of GaN deposited nano films using pulsed laser ablation in ethanol;Abdul Amir;International Journal of Nanoelectronics and Materials,2022

4. Gallium Nitride (GaN) : Physics, Devices, and Technology;Medjdoub,2015

5. Gallium Nitride-Based Electronic and Optoelectronic Devices;Wang,2015

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Effect of different laser energies on the structure of aluminum gallium nitride/Psi thin films;Journal of Optics;2024-08-15

2. Optimizing charge transport in hybrid GaN-PEDOT:PSS/PMMADevice for advanced application;Scientific Reports;2024-06-04

3. Fabrication of nanocrystalline SnO2 films by Nd:YAG pulsed laser deposition method for gas sensor applications;Journal of Optics;2024-03-13

4. Improving the rectification characteristics of GaN/Si heterojunction by constructing an interpenetrating two-phase interface layer;Applied Surface Science;2024-03

5. Photoactivation of Ag ions for improved WO3-based optoelectronic devices;Journal of Optics;2024-01-23