Degradation of HTL layers during device operation in PhOLEDs-Reference-Cited by-同舟云学术

Degradation of HTL layers during device operation in PhOLEDs

Published:2009-11 Issue:11 Volume:11 Page:1933-1940
ISSN:1293-2558
Container-title:Solid State Sciences
language:en
Short-container-title:Solid State Sciences

Author:

Sivasubramaniam Varatharajan,Brodkorb Florian,Hanning Stephanie,Buttler Oliver,Loebl Hans Peter,van Elsbergen Volker,Boerner Herbert,Scherf Ullrich,Kreyenschmidt Martin

Publisher

Elsevier BV

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

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5. Very high-efficiency and low voltage phosphorescent organic light-emitting diodes based on a p-i-n junction

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