A review of high energy backscattering spectrometry-Reference-Cited by-同舟云学术

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A review of high energy backscattering spectrometry

Published:1996-11 Issue:2-3 Volume:46 Page:189-197
ISSN:0254-0584
Container-title:Materials Chemistry and Physics
language:en
Short-container-title:Materials Chemistry and Physics

Author:

Tesmer J.R.,Maggiore C.J.,Nastasi M.,Barbour J.C.

Publisher

Elsevier BV

Subject

Condensed Matter Physics,General Materials Science

Reference27 articles.

1. Proc. Thin Film Processing and Characterization of High-Temperature Superconductors, American Vacuum Society 3;Gossett,1988

2. Measurement of the oxygen content in high-Tcsuperconductors: Enhanced resonant ion-scattering analysis

3. High‐energy elastic backscattering of helium ions for compositional analysis of high‐temperature superconductor thin films

4. Backscattering Spectrometry;Chu,1978

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Rutherford forward scattering and elastic recoil detection (RFSERD) as a method for characterizing ultra-thin films;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2014-08

2. Scattering methods;Instrumental Multi-Element Chemical Analysis;1998

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