Electrical and optical surface degradation of silica due to superficial He implantation
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,General Materials Science,Nuclear Energy and Engineering,Civil and Structural Engineering
Reference8 articles.
1. Optical and electrical degradation of H implanted KS-4V quartz glass;González;Fusion Eng. Des.,2005
2. Surface electrical degradation for low mass ion implanted SiO2: dependence on ion mass, energy and dose rate;González de Vicente;Fusion Eng. Des.,2007
3. S.M. Gonzalez, A. Moroño, D.E. Hole, E.R. Hodgson, Surface electrical degradation due to ion bombardment of ITER insulators. J. Nucl. Mater. (2009), doi:10.1016/j.jnucmat.2008.12.200, in press.
4. A. Moroño, E.R. Hodgson, S.M. González de Vicente, Electrical surface degradation of electron irradiated sapphire and silica, J. Nucl. Mater. (2009), doi:10.1016/j.jnucmat.2008.12.199, in press.
5. Surface electrical degradation of helium implanted SiO2;Gonzalez;J. Nucl. Mater.,2007
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Optical properties and laser damage performance of SiO2 irradiated by high-power pulsed electron beam;Acta Physica Sinica;2014
2. Observation of radiation damage in silica glass using ion-induced luminescence;Journal of Nuclear Materials;2013-11
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