White-light speckle photography for measuring deformation, strain, and shape

Author:

Forno C.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. A High Sensitivity Moire Grid Technique for Studying Deformation in Large Objects

2. Displacement Measurement from Double-exposure Laser Photographs

3. ‘Codit’ reflective liquid, 3 M Company, Traffice Control Products Division

4. Stock solutions: A —ammonium dichromate 20 g, concentrated sulphuric acid 14 ml, water to 1 1;B—sodium chloride 45 g, water to 1 1. For use: 1 part A, 1 part B, 10 parts water

5. Patent application no 21631/75

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