Characterization of Materials: XEOL/XAFS-Reference-Cited by-同舟云学术

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Characterization of Materials: XEOL/XAFS

Published:2001 Issue: Volume: Page:1140-1142
ISSN:
Container-title:Encyclopedia of Materials: Science and Technology
language:
Short-container-title:

Author:

Soderholm L.,Liu G.K.,Antonio M.R.,Reid M.F.

Publisher

Elsevier

Reference7 articles.

1. Intrinsic luminescence excitation spectrum and extended x-ray absorption fine structure above the K edge in CaF2;Bianconi;Phys. Rev. B,1978

2. On the sensitivity of the x-ray excited optical luminescence to the local structure of the luminescent Si sites of porous Si;Dalba;Appl. Phys. Lett,1999

3. Luminescence properties and scintillation mechanisms of cerium- and praseodymium-doped lutetium orthoaluminate;Dujardin;J. Phys.: Condens. Matter,1997

4. Luminescence of solids excited by synchrotron radiation;Mikhailin;Nucl. Instrum. Methods Phys. Res. B,1995

5. XEOL of porous silicon;Sham;Nature,1993

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Time-resolved x-ray excited optical luminescence in InGaN/GaN multiple quantum well structures;Journal of Applied Physics;2011-06-15

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