High spatial resolution stress measurements using synchrotron based scanning X-ray microdiffraction with white or monochromatic beam
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference31 articles.
1. Electromigration in thin aluminum films on titanium nitride
2. Electromigration and IC Interconnects
3. Electromigration-induced stress in aluminum conductor lines measured by x-ray microdiffraction
4. X-Ray Microbeam Measurement of Local Texture and Strain in Metals
5. Submicron x-ray diffraction and its applications to problems in materials and environmental science
Cited by 48 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Study of Internal Stress in Conductive and Dielectric Thick Films;Materials;2022-12-06
2. Lattice Strain and Defects Analysis in Nanostructured Semiconductor Materials and Devices by High‐Resolution X‐Ray Diffraction: Theoretical and Practical Aspects;Small Methods;2021-12-23
3. Latest Updates in Next-Generation Energy Technologies and Systems;Principles of Extreme Mechanics (XM) in Design for Reliability (DfR);2021-11-14
4. Probing Mechanics at the Extremes;Principles of Extreme Mechanics (XM) in Design for Reliability (DfR);2021-11-14
5. Experimental and numerical investigation of thermomechanical cycling of notched NiTi shape memory ribbon using SMA model accounting for plastic deformation;Journal of Materials Research and Technology;2021-11
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3