Nanomechanical and in situ TEM characterization of boron carbide thin films on helium implanted substrates: Delamination, real-time cracking and substrate buckling-Reference-Cited by-同舟云学术

Nanomechanical and in situ TEM characterization of boron carbide thin films on helium implanted substrates: Delamination, real-time cracking and substrate buckling

Published:2015-07 Issue: Volume:639 Page:54-64
ISSN:0921-5093
Container-title:Materials Science and Engineering: A
language:en
Short-container-title:Materials Science and Engineering: A

Author:

Framil Carpeño David^ORCID,Ohmura Takahito,Zhang Ling,Leveneur Jérôme,Dickinson Michelle,Seal Christopher,Kennedy John,Hyland Margaret

Publisher

Elsevier BV

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

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