Low-concentration oxygen depth profiling by the 16O(d, α)14N reaction-Reference-Cited by-同舟云学术

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Low-concentration oxygen depth profiling by the 16O(d, α)14N reaction

Published:1978-02 Issue:1-3 Volume:149 Page:289-294
ISSN:0029-554X
Container-title:Nuclear Instruments and Methods
language:en
Short-container-title:Nuclear Instruments and Methods

Author:

Picraux Samuel T.

Publisher

Elsevier BV

Subject

General Medicine

Reference7 articles.

1. Use of the nuclear reaction 16O(d,α)14N in the microanalysis of oxide surface layers

2. Ion beam surface layer analysis;Barcz,1976

3. J. A. Borders and J. M. Harris, these proceedings.

4. Theoretical analysis of the energy spectra of back-scattered ions

Cited by 25 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Oxygen depth profiling using the 16O(d,α)14N nuclear reaction;Journal of Alloys and Compounds;1997-04

2. Analysis of light elements with a nuclear microprobe — A review;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-09

3. Analysis of oxygen by charged particle bombardment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1992-03

4. Oxygen depth profiling in thin films using the 16O(3He, α)15O nuclear reaction;Vacuum;1991-01

5. Ion beam analysis of laser-deposited high Tc YBa2Cu3O7 superconducting thin films;Journal of Materials Research;1990-09

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