Author:
Takai M.,Gamo K.,Yagita H.,Masuda K.,Namba S.,Mizobuchi A.
Cited by
9 articles.
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1. Ion Implantation in Iii–V Semiconductors;Materials Processing: Theory and Practices;1989
2. Ion-Induced Characteristic X-Ray Emission in Solids;physica status solidi (b);1987-01-01
3. Proton induced X-ray excitation applied to lattice location studies in molybdenum (cobalt) by channeling;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1984-04
4. Specific applications of a 350 kv ion accelerator for PIXE analysis of solid state samples;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1984-04
5. Displacement of cobalt impurities in molybdenum (cobalt) studied by X-ray excitation with channeled protons;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1984-03