Isotope effect in the study of H-W(100) and O-W(100) chemisorption systems using SIMS
Author:
Publisher
Elsevier BV
Subject
General Medicine
Reference7 articles.
1. Developments in secondary ion mass spectroscopy and applications to surface studies
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5. On the energy distribution of sputtered dimers
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1. Charged and excited states of sputtered atoms;Topics in Applied Physics;1991
2. Secondary ions from hydrogen ion bombardment of metal surfaces;Journal of Applied Physics;1980-08
3. Ionization Mechanism ofH+Sputtered from Hydrogenated Silicon;Physical Review Letters;1979-09-17
4. Secondary ion mass spectrometry of molecular solids. Cluster formation during ion bombardment of frozen water, benzene, and cyclohexane;Journal of the American Chemical Society;1979-04
5. SIMS study of the mechanism of cluster formation during ion bombardment of alkali halides;The Journal of Chemical Physics;1978-12
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