Analysis of surface contaminant covering by ion-electron spectroscopy methods-Reference-Cited by-同舟云学术

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Analysis of surface contaminant covering by ion-electron spectroscopy methods

Published:1980-01 Issue:1-3 Volume:168 Page:585-588
ISSN:0029-554X
Container-title:Nuclear Instruments and Methods
language:en
Short-container-title:Nuclear Instruments and Methods

Author:

Soszka M.,Soszka W.

Publisher

Elsevier BV

Subject

General Medicine

Reference9 articles.

1. Surface analysis by ion-electron spectroscopy; Silicon target

2. Proc. 10th Int. Conf. on Phenomena in ionized gases;Hagstrum,1971

3. Proc. Int. Conf. on Surface analysis - 79;Soszka,1979

4. Extension of the Electron-Promotion Model to Asymmetric Atomic Collisions

5. ESCA Atomic, molecular and solid structure studied by means of electron spectroscopy;Siegbahn,1967

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Kinetic electron emission from solid surfaces under ion bombardment;Particle Induced Electron Emission II;1992

2. An ion-induced crystal current study of clean, sulphided and oxidized Cu(100);Surface Science;1988-01

3. Bulk and surface ion-electron emission at the Curie point from nickel;Nuclear Instruments and Methods;1981-04

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