Evolution de la teneur en oxygene lors de son dosage en surface par reaction nucleaire-Reference-Cited by-同舟云学术

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Evolution de la teneur en oxygene lors de son dosage en surface par reaction nucleaire

Published:1971-06 Issue:1 Volume:94 Page:165-171
ISSN:0029-554X
Container-title:Nuclear Instruments and Methods
language:de
Short-container-title:Nuclear Instruments and Methods

Author:

Weber G.,Quaglia L.

Publisher

Elsevier BV

Subject

General Medicine

Reference12 articles.

1. Determination of alumina film thickness by alpha particle scattering

2. Microanalysis of the stable isotopes of oxygen by means of nuclear reactions

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Oxygen diffusion in silicon and the influence of different dopants;Journal of Applied Physics;1980

2. A study of thermally oxidized SiO2 surface layers by means of nuclear reactions;Journal of Radioanalytical Chemistry;1973-09

3. Determination of the total amount of oxygen atoms in silicon oxide surface layers by the nuclear reactions16O(d, p1)17O* and16O(d, α)14N;Physica Status Solidi (a);1973-03-16

4. Application de la methode de dosage en surface a l'aide des reactions nucleaires pour l'evaluation de l'interference surface-masse;Journal of Radioanalytical Chemistry;1973-03

5. Measurement of oxygen-diffusion-profiles in silicon-single-crystals by means of the nuclear reaction;Nuclear Instruments and Methods;1973-01

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