1. K-shell ionization cross sections of Al, Si, S, Ca, and Zn for oxygen ions in the energy range 1.1–8 MeV;Physical Review A;1992-03-01
2. Quantitative PIXE analysis using a scanning proton microbeam;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1991-04
3. K-shell ionization cross sections for Si, P, K, Ca, Zn, and Ga by protons and carbon ions in the energy range 1–6.4 MeV;Physical Review A;1990-01-01
4. Accurate measurement of the relative Si(Li) detector efficiency for X-ray energies below 5 keV;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1989-03
5. Ion Induced X-ray Emission;Ion Beans for Materials Analysis;1989