Use of 71Ge source for thickness measurement of iron films
Author:
Publisher
Elsevier BV
Subject
General Engineering
Reference6 articles.
1. Film Thickness by X-Ray Emission Spectrography
2. Radioisotope sources for X-ray fluorescence analysis
3. Photon cross sections from 0.1 keV to 1 MeV for elements Z = 1 to Z = 94
4. Progress in monitoring thin film thickness with quartz crystal resonators
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Survey of industrial, agricultural, and medical applications of radiometric gauging and process control;Journal of Research of the National Institute of Standards and Technology;1990-11
2. Determination of surface‐spin orientations of rare‐earth iron garnet films by depth‐selective Mössbauer spectroscopy;Journal of Applied Physics;1986-08-15
3. Depth selective conversion electron Mössbauer spectroscopy by use of a proportional counter;Hyperfine Interactions;1983-12
4. Magnetic properties of H+ implanted bubble garnet films by means of depth selective conversion electron Mössbauer spectroscopy;Hyperfine Interactions;1983-12
5. Energy distributions of 7.3 keV electrons passing through iron films for depth-selective Mössbauer spectroscopy;Nuclear Instruments and Methods in Physics Research;1983-01
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