Analyse sous helium par la technique de fluorescence X induite par protons-Reference-Cited by-同舟云学术

Analyse sous helium par la technique de fluorescence X induite par protons

Published:1975-12 Issue:3 Volume:131 Page:563-565
ISSN:0029-554X
Container-title:Nuclear Instruments and Methods
language:fr
Short-container-title:Nuclear Instruments and Methods

Author:

Modjtahed-Zadeh R.,Rastegar B.,Gallmann A.,Guillaume G.,Jundt F.,Sioshansi P.

Publisher

Elsevier BV

Subject

General Medicine

Reference5 articles.

1. Trace element analysis using proton-induced X-ray emission spectroscopy

2. D. M. Stupin, P. Fintz, A. Gallmann, H. E. Gove, G. Guillaume, A. Pape and J. C. Sens, Internal Report, C.R.N. - L.P.N.I.N. 7202, Strasbourg, France.

3. Preparation of thin film deposits from biological, environmental and other matter

4. Proton induced X-ray emission as a tool for trace element analysis

5. Quantitative X-ray analysis

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