Depletion depth determination in semiconductor radiation detectors-Reference-Cited by-同舟云学术

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Depletion depth determination in semiconductor radiation detectors

Published:1970-02 Issue:1 Volume:78 Page:175-176
ISSN:0029-554X
Container-title:Nuclear Instruments and Methods
language:en
Short-container-title:Nuclear Instruments and Methods

Author:

Erramuspe H.J.

Publisher

Elsevier BV

Subject

General Medicine

Reference33 articles.

1. Mobility of Impurity Ions in Germanium and Silicon

2. Diffusion of Donor and Acceptor Elements in Silicon

3. Ion Drift in an n‐p Junction

4. Thick junction radiation detectors made by ion drift

5. The "State-of-The Art" in Nuclear Particle Detectors

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Automatic Control of the Drifting Process for Semiconductor Radiation Detectors;Review of Scientific Instruments;1971-03

2. The charge collection process in pin junction radiation detectors;Nuclear Instruments and Methods;1970-12

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