Depth profiling of helium in Ni and Nb; comparison of different methods-Reference-Cited by-同舟云学术

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Depth profiling of helium in Ni and Nb; comparison of different methods

Published:1978-11 Issue:1 Volume:157 Page:75-81
ISSN:0029-554X
Container-title:Nuclear Instruments and Methods
language:en
Short-container-title:Nuclear Instruments and Methods

Author:

Scherzer B.M.U.,Bay H.L.,Behrisch R.,Børgesen P.,Roth J.

Publisher

Elsevier BV

Subject

General Medicine

Reference47 articles.

1. A technique for measuring hydrogen concentration versus depth in solid samples

2. Proc. 7th Lunar Science Conf.;Müller,1976

3. Surface effects in controlled fusion,1974

4. Surface effects in controlled fusion devices,1976

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