Author:
Fink D.,Biersack J.P.,Grawe H.,Riederer J.,Müller K.,Henkelmann R.
Cited by
14 articles.
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1. The role and application of ion beam analysis for studies of plasma-facing components in controlled fusion devices;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2016-03
2. Application of nuclear reaction geometry for 3He depth profiling in nuclear ceramics;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-05
3. Study on boron depth profiles in boron-doped diamond films by broad resonance reaction 11B(p,α)8Be at Ep=660 keV;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1999-02
4. Neutron depth profiling: Overview and description of NIST facilities;Journal of Research of the National Institute of Standards and Technology;1993-01
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