Author:
Etzkorn H.W.,Kirschner J.
Cited by
35 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Toward understanding weak matrix effects in TOF SIMS;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2018-05
2. Sputtering;Computer Simulation of Ion-Solid Interactions;1991
3. Surface and depth analysis based on sputtering;Topics in Applied Physics;1991
4. Quantitative predictions of sputtering phenomena;Surface and Interface Analysis;1989-12
5. SIMS analysis, under caesium bombardment, of Si in GaAs/(Al, Ga) as superlattices: Detection limit and depth resolution;Surface and Interface Analysis;1988-08