X-ray mirror reflectivities from 3.8 to 50 keV (3.3 to 0.25 Å) Part II—Pt, Si and other materials-Reference-Cited by-同舟云学术

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X-ray mirror reflectivities from 3.8 to 50 keV (3.3 to 0.25 Å) Part II—Pt, Si and other materials

Published:1982-04 Issue:1-2 Volume:195 Page:91-95
ISSN:0167-5087
Container-title:Nuclear Instruments and Methods in Physics Research
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research

Author:

Bilderback D.H.,Hubbard S.

Publisher

Elsevier BV

Subject

General Engineering

Reference12 articles.

1. D.H. Bilderback and S. Hubbard, these Proceedings, p. 85.

2. Interferenz von Röntgenstrahlen an dünnen Schichten

3. Surface Studies of Solids by Total Reflection of X-Rays

4. The optical principles of the diffraction of X-rays;James,1962

5. X-rays in theory and experiment;Compton,1935

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