Modification of a secondary ion mass spectrometer to allow the examination of highly radioactive specimens-Reference-Cited by-同舟云学术

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Modification of a secondary ion mass spectrometer to allow the examination of highly radioactive specimens

Published:1981-02 Issue:1 Volume:180 Page:109-116
ISSN:0029-554X
Container-title:Nuclear Instruments and Methods
language:en
Short-container-title:Nuclear Instruments and Methods

Author:

Bart G.,Aerne T.,Flückiger U.,Sprunger E.

Publisher

Elsevier BV

Subject

General Medicine

Reference8 articles.

1. ATOMIKA, Technische Physik GmbH, D-8000 München 19.

2. Secondary ion mass spectrometry, special publication 427;Heinrich,1975

3. Proc. of the 7th Int. Vac. Congr. and the 3rd Int. Conf. on Solid surfaces;Wittmaack,1977

4. Cefilac, Joints Fargère Industrie, F-42029 Saint-Etienne.

Cited by 8 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Site‐specific specimen preparation for SIMS analysis of radioactive samples;Journal of Microscopy;2020-11-22

2. Secondary ion mass spectrometry of irradiated nuclear fuel and cladding: An overview;International Journal of Mass Spectrometry;2007-06

3. A new shielded SIMS instrument for analysis of highly radioactive materials;Applied Surface Science;2003-01

4. Radial plutonium and fission product isotope profiles in mixed oxide fuel pins evaluated by secondary ion mass spectrometry;Journal of Nuclear Materials;1993-06

5. Measurement of carbon distribution in nuclear fuel pin cladding specimens by means of a secondary ion mass spectrometer;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1986-11

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