Regularized LTI system identification in the presence of outliers: A variational EM approach-Reference-Cited by-同舟云学术

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Regularized LTI system identification in the presence of outliers: A variational EM approach

Published:2020-11 Issue: Volume:121 Page:109152
ISSN:0005-1098
Container-title:Automatica
language:en
Short-container-title:Automatica

Author:

Lindfors Martin,Chen Tianshi

Funder

Knut and Alice Wallenberg Foundation

National Natural Science Foundation of China

Thousand Youth Talents Plan

Shenzhen Science and Technology Innovation Council

Chinese University of Hong Kong

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Control and Systems Engineering

Reference30 articles.

1. Handbook of mathematical functions: with formulas, graphs, and mathematical tables (vol. 55);Abramowitz,1964

2. The variational Bayesian EM algorithm for incomplete data: with application to scoring graphical model structures;Beal;Bayesian Statistics,2003

3. Nonlinear programming;Bertsekas,1999

4. Mathematical statistics: basic ideas and selected topics (vol I);Bickel,2001

5. Pattern recognition and machine learning;Bishop,2006

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