Use of the dirichlet process for reliability analysis-Reference-Cited by-同舟云学术

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Use of the dirichlet process for reliability analysis

Published:1994-09 Issue:1-4 Volume:27 Page:339-343
ISSN:0360-8352
Container-title:Computers & Industrial Engineering
language:en
Short-container-title:Computers & Industrial Engineering

Author:

Kary Chien Wei-Ting,Kuo Way

Publisher

Elsevier BV

Subject

General Engineering,General Computer Science

Reference9 articles.

1. Optimal Burn-In Simulation on Highly Integrated Circuit Systems;Chien;IIE Transactions,1992

2. The Variance Reduction of the Simulation for the Dirichlet Distributions;Chien,1994

3. A Bayesian Analysis of Some Nonparametric Problems;Ferguson;Annals of Statistics,1973

4. Bayesian Density Estimation by Mixtures of Normal Distributions;Ferguson,1983

5. A Bayesian Methodology for Assessing Reliability during Product Development;Kaplan,1990

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Modeling and Analyzing Yield, Burn-In and Reliability for Semiconductor Manufacturing: Overview;Springer Handbook of Engineering Statistics;2006

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