Unified data path allocation and BIST intrusion-Reference-Cited by-同舟云学术

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Unified data path allocation and BIST intrusion

Published:1999-09 Issue:1 Volume:28 Page:55-99
ISSN:0167-9260
Container-title:Integration
language:en
Short-container-title:Integration

Author:

Olcoz Katzalin,Tirado Francisco,Mecha Hortensia

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference35 articles.

1. Recent development in high level synthesis;Lin;ACM Trans. Des. Automa. Electron. Systems,1997

2. High-Level Synthesis Introduction to Chip and System Design;Gasjki,1992

3. The VLSI circuit test problem-a tutorial;Hawkins;IEEE Trans. Ind. Electron.,1989

4. Testing systems on a chip;Chandramouli;IEEE Spectrum,1996

5. Digital System Testing and Testable Design;Abramovici,1990

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Concurrent BIST Synthesis and Test Scheduling Using Genetic Algorithms;International Journal of Computers and Applications;2007-01

2. Integrating testability with design space exploration;Microelectronics Reliability;2003-05

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