Scanning Electron Microscopy at Very Low Temperatures-Reference-Cited by-同舟云学术

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Scanning Electron Microscopy at Very Low Temperatures

Published:1988 Issue: Volume: Page:1-78
ISSN:0065-2539
Container-title:Advances in Electronics and Electron Physics
language:
Short-container-title:

Author:

Huebener R.P.

Publisher

Elsevier

Reference105 articles.

1. Proceed. Fifth Internat. Conf. on Phonon Scattering in Condensed Matter;Anderson,1986

2. Tunneling Between Superconductors

3. Scanned Image Microscopy;Ash,1980

4. Solid State Physics;Ashcroft,1976

5. Physics and Applications of the Josephson Effect;Barone,1982

Cited by 25 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Scanning Electron Microscopy;Springer Handbook of Microscopy;2019

2. Phase-coherent solitonic Josephson heat oscillator;Scientific Reports;2018-08-16

3. A high-resolution combined scanning laser and widefield polarizing microscope for imaging at temperatures from 4 K to 300 K;Review of Scientific Instruments;2017-12

4. Effect of the microstructure of epitaxial YBa2Cu3O7 − x films on their electrophysical and nonlinear microwave properties;Physics of the Solid State;2006-12

5. Grain boundaries in high-Tcsuperconductors;Reviews of Modern Physics;2002-05-17

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