Performance and Reliability of Third-Generation Image Intensifies-Reference-Cited by-同舟云学术

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Performance and Reliability of Third-Generation Image Intensifies

Published:1986 Issue: Volume: Page:61-69
ISSN:0065-2539
Container-title:Photo-Electronic Image Devices, Proceedings of the Eighth Symposium
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Author:

Pollehn H.K.

Publisher

Elsevier

Reference3 articles.

1. High quantum efficiency photoemission from GaAs1−xPxalloys

2. Recent advancements in the field of image intensification: the generation 3 wafer tube

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1. Design of High-Speed Driver Circuits Based on Thick Film Technology;2021 IEEE Conference on Telecommunications, Optics and Computer Science (TOCS);2021-12-10

2. Equivalent Method of Solving Quantum Efficiency of Reflection-Mode Exponential Doping GaAs Photocathode;Chinese Physics Letters;2009-09-29

3. Laser ranging and mapping with a photon-counting detector;Applied Optics;1996-01-20

4. Effects of electrode structure on output electron energy distribution of microchannel plates;Review of Scientific Instruments;1986-03

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