Comparison of silicon and OH-modified AFM tips for adhesion force analysis on functionalised surfaces and natural polymers

Author:

Colson Jérôme,Andorfer Laurin,Nypelö Tiina Elina,Lütkemeier Bernd,Stöckel Frank,Konnerth Johannes

Funder

Austrian Science Fund FWF

Publisher

Elsevier BV

Subject

Colloid and Surface Chemistry

Reference36 articles.

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2. Chemical identification of individual surface atoms by atomic force microscopy;Sugimoto;Nature,2007

3. Application of atomic force spectroscopy (AFS) to studies of adhesion phenomena: a review;Leite;At. Force Microsc. Adhes. Stud.,2005

4. Mapping interaction forces with the atomic force microscope;Radmacher;Biophys. J.,1994

5. The atomic force spectroscopy as a tool to investigate surface forces: basic principles and applications;Leite;Mod. Res. Educ. Top. Microsc.,2007

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