Characterization of natural and manufactured nanoparticles by atomic force microscopy: Effect of analysis mode, environment and sample preparation-Reference-Cited by-同舟云学术

Characterization of natural and manufactured nanoparticles by atomic force microscopy: Effect of analysis mode, environment and sample preparation

Published:2013-02 Issue: Volume:419 Page:238-247
ISSN:0927-7757
Container-title:Colloids and Surfaces A: Physicochemical and Engineering Aspects
language:en
Short-container-title:Colloids and Surfaces A: Physicochemical and Engineering Aspects

Author:

Baalousha M.,Lead J.R.

Publisher

Elsevier BV

Subject

Colloid and Surface Chemistry

Reference63 articles.

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