Colloidal interactions for a polystyrene particle and a smooth silicon surface: Atomic force microscopy, XDLVO theory, and Surface Element Integration-Reference-Cited by-同舟云学术

Colloidal interactions for a polystyrene particle and a smooth silicon surface: Atomic force microscopy, XDLVO theory, and Surface Element Integration

Published:2023-08 Issue: Volume:670 Page:131315
ISSN:0927-7757
Container-title:Colloids and Surfaces A: Physicochemical and Engineering Aspects
language:en
Short-container-title:Colloids and Surfaces A: Physicochemical and Engineering Aspects

Author:

Thwala Justice M.,Mathunjwa Jochonia,Mkhonta Simiso K.,Bwembya Gabriel C.,Mamba Bhekie

Publisher

Elsevier BV

Subject

Colloid and Surface Chemistry

Reference42 articles.

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2. Effect of membrane surface roughness on colloid–membrane DLVO interactions;Hoek;Langmuir,2003

3. Particle Deposition and Aggregation: Measurement, Modelling and Simulation;Elimelech,1995

4. Effect of membrane surface roughness on colloid–membrane DLVO interactions;Bowen;J. Colloid Interface Sci.,2000

5. The use of atomic force microscopy to quantify membrane surface electrical properties;Bowen;Colloid Surf. A-Physicochem. Eng. Asp.,2002

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