Utilisation of bent Si crystals for elastic strain measurements
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. Neutron diffraction methods for the study of residual stress fields
2. Proc. of a NATO Advanced Research Workshop ARW-900814: measurement of residual and applied stress using neutron diffraction;Kocsis,1991
3. A novel approach to dynamical neutron diffraction by a deformed crystal
4. An elastically bent silicon crystal as a monochromator for thermal neutrons
5. Neutron optics using non-perfect crystals
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2. On the Resolution in Strain/Stress Measurements on Bulk Polycrystalline Samples by 3-Axis Neutron Diffractometer;Physics of Metals and Metallography;2022-11-10
3. High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part II;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2020-10
4. High-Resolution Analysis Using Bent Perfect Crystal in Powder Diffraction: Part I;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2020-10
5. High-Resolution Neutron Diffraction Setting for Studies of Macro- and Microstrains in Polycrystalline Materials;Materials Research Proceedings;2018-09-11
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