Resonant X-ray reflectivity study of Fe/Cr superlattices
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference9 articles.
1. Interfacial roughness in InAs/GaAs heterostructures determined by soft x‐ray reflectivity
2. X-ray specular reflection studies of silicon coated by organic monolayers (alkylsiloxanes)
3. Grazing x‐ray reflection analysis of nanometric scale structures
4. Resonant x-ray reflectivity measurements of a Ni/Fe alloy thin film: A composition profile
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