Author:
Kim Y.D.,Han S.U.,Kang H.S.,Kang B.K.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference16 articles.
1. N. Kimizuka, T. Yamamoto, T. Mogami, K. Yamaguchi, K. Imai, T. Horiuchi, in: 1999 VLSI Technical Digest, 1999, pp. 73–74.
2. W. Abadeer, W. Ellis, in: Proceedings of the 2003 IEEE International Reliability Physics Symposium, 2003, pp. 17–22.
3. Dynamic Bias-Temperature Instability in Ultrathin SiO2and HfO2Metal-Oxide-Semiconductor Field Effect Transistors and Its Impact on Device Lifetime
4. M.A. Alam, in: 2003 IEDM Technical Digest, 2003, pp. 345–348.
5. Evidence for bulk trap generation during NBTI phenomenon in pMOSFETs with ultrathin SiON gate dielectrics
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献