Shear loading of FCC/BCC Cu/Nb nanolaminates studied by in situ X-ray micro-diffraction-Reference-Cited by-同舟云学术

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Shear loading of FCC/BCC Cu/Nb nanolaminates studied by in situ X-ray micro-diffraction

Published:2023-05 Issue: Volume:276 Page:111999
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Navarro Etienne,Cornelius Thomas W.,Proudhon Henry,Sahay Rahul,Radchenko Ihor,Escoubas Stéphanie,Lee Pooi See,Raghavan Nagarajan,Budiman Arief S.,Thomas Olivier

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference28 articles.

1. Effects of interface shear strength during failure of semicoherent Metal–Metal nanolaminates: An example of accumulative roll-bonded Cu/Nb

2. The roles of interfaces and other microstructural features in Cu/Nb nanolayers as revealed by in situ beam bending experiments inside an scanning electron microscope (SEM)

3. Free sliding in lattices with two incommensurate periodicities

4. Superglide at an Internal Incommensurate Boundary

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