1. W. Steinhoegl, G. Schindler, G. Steinlesberger, M. Traving, M. Engelhardt, in: 2003 IEEE International Conference on Simulation of Semiconductor Processes and Devices, 2003, pp. 27–30
2. On the atomistic details of electromigration-induced drift
3. T.S. Kuan, C.K. Inoki, G.S. Oehrlein, K. Rose, Y.-P. Zhao, G.-C. Wang, S.M. Rossnagel, C. Cabral, in: K. Maex, Y.-C. Joo, G.S. Oehrlein, S. Ogawa, J.T. Wetzel (Eds.), Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics, Materials Research Society Symposium Proceedings 612, Material Research Society, 2002, pp. 1–8
4. Intl. Tech. Roadmap for Semiconductors http://public.itrs.net/Files/2003ITRS/Home2003.htm
5. Kinetics of ordering in two dimensions. II. Quenched systems