New SPM concept for accurate and repeatable tip positioning-Reference-Cited by-同舟云学术

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New SPM concept for accurate and repeatable tip positioning

Published:2009-04 Issue:4-6 Volume:86 Page:1234-1237
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Duriau E.,Clarysse T.,Moussa A.,Vanhaeren D.,Eyben P.,Hantschel T.,Vandervorst W.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. Tunneling through a controllable vacuum gap

2. MAGNETIC FORCE MICROSCOPY

3. Evaluation of the junction delineation accuracy and reproducibility with the SSRM technique

4. Probing the conducting paths in a metal - insulator composite by conducting atomic force microscopy

5. Controlled manipulation of molecular samples with the nanoManipulator

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