Author:
Pu A.,Thomson D.J.,Bridges G.E.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference26 articles.
1. R. Rajsuman, Iddq testing for CMOS VLSI, in: Proceedings of the IEEE, vol. 88, 2000, p. 544.
2. W. Mertin, R. Weber, F. Seifert, E. Kubalek, G. Zimmermann, C. Boit, Contactless failure analysis of integrated circuits via current contrast imaging with magnetic force microscopy, in: Proceedings of the 27th International Symposium Testing and Failure Analysis, Santa Clara, CA, 2001, pp. 199–208.
3. Magnetic force microscopy/current contrast imaging: A new technique for internal current probing of ICs
4. An example of fault site localization on a 0.18 μm CMOS device with combination of front and backside techniques
5. New physical techniques for IC functional analysis of on-chip devices and interconnects
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