Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices-Reference-Cited by-同舟云学术

Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices

Published:2014-05 Issue: Volume:120 Page:67-70
ISSN:0167-9317
Container-title:Microelectronic Engineering
language:en
Short-container-title:Microelectronic Engineering

Author:

Celano Umberto,Goux Ludovic,Opsomer Karl,Iapichino Martina,Belmonte Attilio,Franquet Alexys,Hoflijk Ilse,Detavernier Christophe,Jurczak Malgorzata,Vandervorst Wilfried

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference23 articles.

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5. L. Goux, K. Sankaran, G. Kar, N. Jossart, K. Opsomer, R. Degraeve, G. Pourtois, G. Rignanese, C. Detavernier, in: VLSI Technology (VLSIT), 2012 Symposium On, Honolulu, HI, 2012, pp. 69–70.

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