Short communication: Assessment of the dislocation density using X-ray topography in Al single crystals annealed for long times near the melting temperature-Reference-Cited by-同舟云学术

Short communication: Assessment of the dislocation density using X-ray topography in Al single crystals annealed for long times near the melting temperature

Published:2019-12 Issue: Volume:21 Page:100613
ISSN:2352-4928
Container-title:Materials Today Communications
language:en
Short-container-title:Materials Today Communications

Author:

Singh S.P.,Huang X-R.,Kumar P.,Kassner M.E.

Funder

National Science Foundation

Publisher

Elsevier BV

Subject

Materials Chemistry,Mechanics of Materials,General Materials Science

Reference24 articles.

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3. On the dislocation density in aluminum during harper-dorn creep;Meyrick;Scripta Metall. Mater.,1989

4. The interpretation of etch patterns on aluminum;Forty;J. Phys. Soc. Jap.,1955

5. Modeling of work hardening and stress saturation in FCC metals;Nes;Prog. Mater. Sci.,1998

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