Space radiation induced failure rate calculation method using energy deposition probability function for high-voltage semiconductor device

Author:

Khurelbaatar Luvsanbat,Tumenjargal Turtogtokh,Tumendemberel Begzsuren,Myagmar Otgonbaatar,Gollapudi Srikanth,Omura Ichiro,Dashdondog ErdenebaatarORCID

Funder

Ministry of Education

Australian Research Council

Publisher

Elsevier BV

Subject

Materials Chemistry,Mechanics of Materials,General Materials Science

Reference27 articles.

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3. Erdenebaatar Dashdondog , Masaki Sudo , Ichiro Oumra Yuji Shiba , Formulation of single event burnout failure rate for high voltage devices in satellite electrical power system, In: Proceedings of the 2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD), Sapporo, Japan, 2017.

4. The econimic impacts of the commercial space industry;Kelly Whealan;Space Policy,2019

5. Global commercial space industry indicators and trends;Christensen;Acta Astronaut.,2002

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