Monolayer XN2 (X Ti, Zr, Hf): Novel 2D materials with high stability, simultaneously high electron and hole mobilities from density functional theory
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Mechanics of Materials,General Materials Science
Reference68 articles.
1. Electric field effect in atomically thin carbon films;Novoselov;Science,2004
2. Structures, stabilities, and electronic properties of defects in monolayer black phosphorus;Li;Sci. Rep.,2015
3. First-principles studies on the superconductivity of aluminene;Yeoh;Appl. Surf. Sci.,2018
4. Stability, electronic and thermodynamic properties of aluminene from first-principles calculations;Yuan;Appl. Surf. Sci.,2017
5. Surface-regulated triangular borophene as Dirac-like materials from density functional calculation investigation;Fang;Chin. Phys. B,2020
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