Negative capacitance in epitaxial ferroelectric capacitors evidenced by dynamic dielectric characterization-Reference-Cited by-同舟云学术

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Negative capacitance in epitaxial ferroelectric capacitors evidenced by dynamic dielectric characterization

Published:2021-03 Issue: Volume:26 Page:102076
ISSN:2352-4928
Container-title:Materials Today Communications
language:en
Short-container-title:Materials Today Communications

Author:

Boni Georgia Andra^ORCID,Chirila Cristina,Filip Lucian Dragos,Pintilie Ioana,Pintilie Lucian

Publisher

Elsevier BV

Subject

Materials Chemistry,Mechanics of Materials,General Materials Science

Reference28 articles.

1. Physics of Ferroelectrics,2007

2. Ferroelectric Random Access Memories: Fundamentals and Applications;Ishiwara,2004

3. Thin Film Ferroelectric Materials and Devices;Ramesh,2013

4. Ferroelectric Memories;Scott,2000

5. Ferroelectric Materials and Their Applications;Xu,2013

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Homogeneous versus Inhomogeneous Polarization Switching in PZT Thin Films: Impact of the Structural Quality and Correlation to the Negative Capacitance Effect;Nanomaterials;2021-08-20

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