Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference26 articles.
1. Pavlov A, Sachdev M. CMOS SRAM circuit design and parametric test in nano-scaled technologies: process-aware SRAM design and test. Springer; 2008.
2. Maziar G, Tohru I, Hamid N. Variation-aware software techniques for cache leakage reduction using value-dependence of SRAM leakage due to within-die process variation. In: Proceedings of the 3rd international conference on High performance embedded architectures and compilers. Springer-Verlag: Goteborg, Sweden; 2008.
3. Nanoscale Integration and Modeling (NIMO) Group, Arizona State University (ASU). .
4. Nanometer MOSFET variation in minimum energy subthreshold circuits;Verma;IEEE Trans Electron Dev,2008
5. Digital integrated circuits: a design perspective;Rabaey,2005
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