Author:
Tan Cher Ming,Lim Kim Peng,Chai Tai Chong,Lim Guat Cheng
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference4 articles.
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2. Analysis of Capacitive Voltage Contrast in Scanning Electron Microscopy;Yoshio;Japanese Journal of Applied Physics,1985
3. Time-resolved Capacitive Coupling Voltage Contrast-A new voltage measurement technique for passivated devices;Cole;Appl Phys Lett,1986
4. R.F. Egerton, course note of PHYS319 in http://laser.phys.ualberta.ca/~egerton/SEM/sem.htm.
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1 articles.
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