1. Smith L. Decoupling capacitor calculations for CMOS circuits. In: IEEE 3rd topical meeting electrical performance of electronics packaging. 2–4 November 1994. p. 101–5.
2. Herbert J. Production of ceramic material, US Patent 3,041,189, 26 June 1962.
3. Donahoe D, Hillman C, Pecht M. Failures in base metal electrode capacitors. In: 23rd Capacitor and resistor technical symposium. March 31–April 3, 2003. p. 129–33.
4. Electronic Industries Association, Ceramic dielectric capacitors classes I, II, II and IV, Part II: Test methods, Revision E, EIA-198-2, Arlington, VA. January 1998.
5. Brusse J, Sampson M. COTS Ceramic chip capacitors: an evaluation of the parts and assurance methodologies. In: 24th Capacitor and resistor technical symposium. March 29–April 1, 2004. p. 128–40.