Characterization of a 0.13 μm CMOS Link Chip using Time Resolved Emission (TRE)-Reference-Cited by-同舟云学术

Characterization of a 0.13 μm CMOS Link Chip using Time Resolved Emission (TRE)

Published:2005-09 Issue:9-11 Volume:45 Page:1550-1553
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Stellari Franco,Song Peilin,Hryckowian John,Torreiter Otto A.,Wilson Steve,Wu Phil,Tosi Alberto

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference14 articles.

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4. Tirne-resolved optical measurements from 0.13 m CMOS technology microprocessor using a superconducting single-photon detector;Stellari;International Symposium for Testing and Failure Analysis,2003

5. The structure of chips and links comprising the IBM eServer z990 I/O subsystem;Chencinski;IBMJ Res & Dev,2004

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