Improvement in high-temperature degradation by isotropic conductive adhesives including Ag–Sn alloy fillers

Author:

Yamashita M.,Suganuma K.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Degradation mechanism of Ag-epoxy conductive adhesive/Sn–Pb plating interface by heat exposure;Yamashita;J Electron Mater,2002

2. New conductive adhesive based on poly(3,4-ethylene dioxythiophene);Bouguettaya;Synthetic Metals,1999

3. Yamashita M, Suganuma K, Komagata M, Shirai Y. An improvement of conductive adhesives on elevated temperature endurance by using Ag–Sn alloy powder. In: Proceedings of 1st international IEEE conference on polymers and adhesives in microelectronics and photonics. Incorporating POLY, PEP & adhesives in electronics, Potsdam, October 2001. p. 265–9.

4. Komagata M, Shirai Y, Suzuki K, Suganuma K. Conductive adhesive as solder replacement and circuit therewith. Japan Kokai Tokkyo Koho, 2002. p. 7.

5. Development of conducting adhesive materials for microelectronic applications;Kang;J Electron Mater,1999

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