Research on the effect of single-event transient of an on-chip linear voltage regulator fabricated on 130 nm commercial CMOS technology-Reference-Cited by-同舟云学术

Research on the effect of single-event transient of an on-chip linear voltage regulator fabricated on 130 nm commercial CMOS technology

Published:2017-06 Issue: Volume:73 Page:116-121
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Zhao QiFeng,Yang GuoQing,Sun YongJie,Yu PeiFu,Chen JianJun,Liang Bin

Funder

National Natural Science Foundation of China

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference16 articles.

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3. Single-event effects in analog and mixed-signal integrated circuits;Turflinger;IEEE Trans. Nucl. Sci.,1996

4. Analysis of single-event transients in analog circuits;Adell;IEEE Trans. Nucl. Sci.,2000

5. Single-event transients in voltage regulators;Johnston;IEEE Trans. Nucl. Sci.,2006

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